WebSINGLE EVENT UPSET (SEU) MITIGATION TECHNIQUES 31. kind of redundancy, which can be provided by extra components (hardware redundancy) or by an extra execution … WebA single-event upset (SEU), also known as a single-event error (SEE), is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a …
Engineering:Single-event upset - HandWiki
WebFirst, a state space model developed to analytically characterize single-event upsets in memory elements is presented. The model takes into consideration the single-event waveform shape in order to predict whether or not an upset will occur in static random access memory (SRAM). WebDescription The hardware logic does not effectively handle when single-event upsets (SEUs) occur. Extended Description Technology trends such as CMOS-transistor down-sizing, use of new materials, and system-on-chip architectures continue to increase the sensitivity of systems to soft errors. asrar lbanat
(PDF) Single Event Upset - ResearchGate
WebSingle Event Effect Type Description Single Event Upset Occurs in a semiconductor device when the radiation absorbed by the device is sufficient to change a cell’s logic state. Multiple Bit Upset Occurs when the energy deposited in the silicon of an electronic component by a single ionizing particle causes upset to more than one bit in the ... WebSingle Event Effects Single Event Effects (SEEs) are caused by a single, energetic particle, and can take on many forms. Single Event Upsets (SEUs) are soft errors, and non-destructive. They normally appear as transient pulses in logic or support circuitry, or as bitflips in memory cells or registers. Several A single-event upset (SEU), also known as a single-event error (SEE), is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a live micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors. The state change … See more Single-event upsets were first described during above-ground nuclear testing, from 1954 to 1957, when many anomalies were observed in electronic monitoring equipment. Further problems were observed in space … See more By definition, SEUs do not destroy the circuits involved, but they can cause errors. In space-based microprocessors, one of the most … See more • In the 2003 elections in Brussels's municipality Schaerbeek (Belgium), an anomalous recorded number of votes triggered an investigation that concluded an SEU was responsible for giving a candidate named Maria Vindevoghel 4,096 extra votes. The … See more Terrestrial SEU arise due to cosmic particles colliding with atoms in the atmosphere, creating cascades or showers of … See more The sensitivity of a device to SEU can be empirically estimated by placing a test device in a particle stream at a cyclotron or other particle accelerator facility. This particular test methodology is especially useful for predicting the SER (soft error rate) in known … See more • Radiation hardening • Cosmic rays • Hamming distance See more General SEU • T.C. May and M.H. Woods, IEEE Trans Electron Devices ED-26, 2 (1979) • www.seutest.com - Soft-error testing resources to support the JEDEC JESD89A test protocol. See more asrar indonesia armaf